X-Ray fluorescence spectrometer ECROS TXRF-9730 MORAY

The X-ray fluorescence spectrometer EСROS TXRF-9730 MORAY is designed for express elemental analysis of solid and liquid samples by X-ray fluorescence with total external reflection. Due to the features of the X-ray optical scheme, detection limits reach tens of ppb.

Features:
∙          The range of chemical element contents detection: from 10 ppb to 100%
∙          Liquid and solid samples
∙          A small amount of the analyzed sample is required
∙          Standard glass slides can be used as a sample carrier
∙          Simultaneously detected elements: from Na¹¹ до Fm¹⁰⁰
∙          Automatic qualitative and quantitative analysis with graduation using samples with known content
∙          Reference-free quantitative analysis by the method of fundamental parameters without the use of reference samples

Operation principle

The principle of operation of EСROS TXRF-9730 MORAY is based on the excitation of sample atoms and subsequent registration of the X-ray fluorescence spectrum of the studied sample material. The energies of the characteristic lines of the spectrum correspond to the chemical elements contained in the sample, and their intensity is proportional to the concentration of the corresponding elements.

A low-power end window X-ray tube is used as a source of primary X-ray radiation. The primary radiation passes through a unique system of collimation and monochromatization. When the sample is irradiated with X-ray radiation, the atoms of the analyzed substance are excited, followed by their emission of characteristic radiation.

The main feature of the instruments implementing the method of X-ray fluorescence analysis with total external reflection is that the X-ray beam falls on the sample at a small angle (below the critical angle of total reflection of X-rays from the substrate), which leads to an almost complete reflection of the exciting beam from the substrate without its excitation. In addition, interference of exciting radiation occurs in the analysis area, which leads to greater excitation of the atoms of the sample material.  As a result, the signal-to-noise ratio increases and detection limits decrease.

Secondary fluorescent radiation from the sample is detected by a silicon drift detector with Peltier element cooling and a carbon input window, the signal from which is processed by an electronic circuit and converted into a spectrum.

The substrate with the sample applied on it is automatically installed using a sample sensor. The X-ray tube and detector are located above the sample, which eliminates the possibility of contamination of the X-ray tube and detector.

Technical specifications:

Range of defined elements: Na¹¹ до Fm¹⁰⁰

X-ray tube: 12 W (end window), Rh (Mo, Ag) anode

SDD detector with electric cooling, resolution < 127 eV, carbon window, sensitive area size 20 mm² (optional up to 50 mm²)

Unique primary radiation collimation system

Air cooling

Overall dimensions (W*H*D): 290*340*410 mm

Weight: 10 kg

The instrument completeness

The basic set includes:

∙ EСROS TXRF-9730 MORAY (analytical unit)

∙ laptop or desktop computer with installed software for working with the spectrometer

∙ a set of spare parts and accessories

Additional options:

∙ additional slides (including sapphire ones)

∙ stirrer

∙ set of micropipettes

∙ printer

∙ solution of the internal reference material